{"isbn_13": ["9780071443722"], "last_modified": {"type": "/type/datetime", "value": "2008-04-29 13:35:46.87638"}, "languages": [{"key": "/l/eng"}], "publishers": ["McGraw-Hill Professional"], "number_of_pages": 240, "first_sentence": {"type": "/type/text", "value": "The number of transistors that can be contained on a silicon device continues to increase year after year."}, "isbn_10": ["007144372X"], "publish_date": "April 29, 2005", "key": "/b/OL7300700M", "authors": [{"key": "/a/OL223763A"}, {"key": "/a/OL338399A"}], "title": "Applied Formal Verification", "type": {"key": "/type/edition"}, "id": 9949722, "revision": 1}